ÿWPCL ûÿ2BJ|xÐ ` ÐÐÌÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿH øÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÿÌÐÐ °°°è ÐÑ Âx„|ü@Ž ÑÐ Å@8Ø'@8Ø'Å Ð3.ÁHÁÓÓÃÃProposed revisions to Recommendation M.110ÄÄ Áà:ÁCIRCUIT TESTINGƒ ÁHÁÃÃAddÄÄ the following sentence at the end of ÀÀ 1.1: Ð ( ÐÁHÁ"Where a circuit uses channel associated signalling, it should be ÂHHÂpossible to identify and measure at the circuit access points, the signal©transmission parameters, e.g. type of signal, sequence, timing, duration, level and frequency."ÆÆ Ð ` Ð ÁHÁÃÃChangeÄÄ the end of ÀÀ 1.6 to read: Ð À ÐÁHÁ"... digital path as possible. With suitable digital test equipment, such digital path access points enable in©service circuit monitoring to be carried out when, for example, digital paths are directly interfaced with digital exchanges or transmultiplexers. ÁHÁWhen the digital path is out of service this same point can be used to transmit and receive signals for both digital path and circuit testing."